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Nanometer-scale Defect Detection Using Polarized Light (Mechanical Engineering and Solid Mechanics: Reliability of Multiphysical Systems
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ISBN
Brand
Wiley-ISTE
Author
Philippe Pougnet, Abdelkhalak El Hami, Pierre-Richard Dahoo
Format
Hardcover
Item Height
241mm
Item Weight
618g
Item Width
167mm
Language
English
Number of Pages
316 Pages
Publication Name
Nanometer-Scale Defect Detection Using Polarized Light
Publication Year
2016
PublishedOn
2016-08-12
Publisher
Iste LTD AND John Wiley & Sons INC International Concepts
Subject
Engineering & Technology
Subject Area
Nanotechnology
Title
Nanometer-scale Defect Detection Using Polarized Light (Mechanic
Type
Textbook
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