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Author
Philippe Pougnet, Abdelkhalak El Hami, Pierre-Richard Dahoo
Publication Name
Nanometer-Scale Defect Detection Using Polarized Light
Publisher
Iste LTD AND John Wiley & Sons INC International Concepts
Subject
Engineering & Technology
Subject Area
Nanotechnology
Title
Nanometer-scale Defect Detection Using Polarized Light (Mechanic